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DATA SHEET
MOS FIELD EFFECT TRANSISTOR
PA1816
P-CHANNEL MOS FIELD EFFECT TRANSISTOR FOR SWITCHING
DESCRIPTION
The PA1816 is a switching device which can be driven directly by a 1.8 V power source. This device features a low on-state resistance and excellent switching characteristics, and is suitable for applications such as power management of notebook computers and so on.
8
PACKAGE DRAWING (Unit: mm)
5 1, 2, 3 : Source 4 : Gate 5, 6, 7, 8: Drain
1.2 MAX. 1.0 0.05 0.25 3 +5 -3 0.1 0.05 0.5 0.6 +0.15 -0.1
FEATURES
* 1.8 V drive available * Low on-state resistance RDS(on)1 = 15 m MAX. (VGS = -4.5 V, ID = -4.5 A) RDS(on)2 = 16 m MAX. (VGS = -4.0 V, ID = -4.5 A) RDS(on)3 = 22.5 m MAX. (VGS = -2.5 V, ID = -4.5 A) RDS(on)4 = 41.5 m MAX. (VGS = -1.8 V, ID = -2.5 A) * Built-in G-S protection diode against ESD
1
4
0.145 0.055
3.15 0.15 3.0 0.1
6.4 0.2 4.4 0.1 1.0 0.2
ORDERING INFORMATION
PART NUMBER PACKAGE Power TSSOP8
0.65 0.27 +0.03 -0.08 0.8 MAX.
PA1816GR-9JG
0.1
0.10 M
ABSOLUTE MAXIMUM RATINGS (TA = 25C)
Drain to Source Voltage (VGS = 0 V) Gate to Source Voltage (VDS = 0 V) Drain Current (DC) (TA = 25C) Drain Current (pulse)
Note1 Note2
VDSS VGSS ID(DC) ID(pulse) PT Tch Tstg
-12
V V A A W C C
EQUIVALENT CIRCUIT
Drain
m 8.0 m 9.0 m 36
2.0 150 -55 to +150
Total Power Dissipation Channel Temperature Storage Temperature
Gate
Body Diode
Gate Protection Diode
Source
Notes 1. PW 10 s, Duty Cycle 1% 2 2. Mounted on ceramic substrate of 5000 mm x 1.1 mm Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for availability and additional information.
Document No. G16252EJ1V0DS00 (1st edition) Date Published July 2002 NS CP(K) Printed in Japan
(c)
2002
PA1816
ELECTRICAL CHARACTERISTICS (TA = 25C)
CHARACTERISTICS Zero Gate Voltage Drain Current Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance Drain to Source On-state Resistance SYMBOL IDSS IGSS VGS(off) | yfs | RDS(on)1 RDS(on)2 RDS(on)3 RDS(on)4 Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Body Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) trr Qrr VDD = -10 V VGS = -4.0 V ID = -9.0 A IF = 9.0 A, VGS = 0 V IF = 9.0 A, VGS = 0 V di/dt = 100 A/ s TEST CONDITIONS VDS = -12 V, VGS = 0 V VGS = MIN. TYP. MAX. UNIT
-1.0
A A
V S
m 8.0 V, VDS = 0 V
-0.45 -0.75
11 22 12.0 12.5 16.2 23.7 1570 400 240 16 132 223 295 15 3.0 4.5 0.82 490 580
m 10
-1.5
VDS = -10 V, ID = -1.0 mA VDS = -10 V, ID = -4.5 A VGS = -4.5 V, ID = -4.5 A VGS = -4.0 V, ID = -4.5 A VGS = -2.5 V, ID = -4.5 A VGS = -1.8 V, ID = -2.5 A VDS = -10 V VGS = 0 V f = 1.0 MHz VDD = -10 V, ID = -4.5 A VGS = -4.0 V RG = 10
15 16 22.5 41.5
m m m m pF pF pF ns ns ns ns nC nC nC V ns nC
TEST CIRCUIT 1 SWITCHING TIME
VGS (-) D.U.T. RL PG. RG VDD
VDS
TEST CIRCUIT 2 GATE CHARGE
D.U.T. IG = -2 mA 50 RL VDD
VGS
Wave Form
0
10%
VGS
90%
VDS (-)
90% 90% 10% 10%
PG.
VDS VGS (-) 0 = 1 s Duty Cycle 1%
Wave Form
0 td(on) ton
tr
td(off) toff
tf
2
Data Sheet G16252EJ1V0DS
PA1816
TYPICAL CHARACTERISTICS (TA = 25C)
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
120
TOTAL POWER DISSIPATION vs. AMBIENT TEMPERATURE
2.5
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
100 80 60 40 20 0 0 25 50 75 100 125 150 175
2
1.5
1
0.5
Mounted on ceramic substrate of 2 5000 mm x 1.1 mm 0 25 50 75 100 125 150 175
0
TA - Ambient Temperature - C FORWARD BIAS SAFE OPERATING AREA TA - Ambient Temperature - C
-100 ID(pulse)
ID - Drain Current - A
-10
ID(DC)
PW = 1 ms
10 ms -1 RDS(on) Limited (VGS = -4.5 V) 100 ms DC
-0.1
Single Pulse Mounted on ceramic substrate of 2 5000 mm x 1.1 mm -1 -10 -100
-0.01 -0.1
VDS - Drain to Source Voltage - V TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH rth(ch-A) - Transient Thermal Resistance - C/W
100 62.5C/W
10
Single Pulse Mounted on ceramic 2 substrate of 5000 mm x 1.1 mm 1
1m 10 m 100 m 1 10 100 1000 PW - Pulse Width - s
Data Sheet G16252EJ1V0DS
3
PA1816
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE FORWARD TRANSFER CHARACTERISTICS
-40 Pulsed
ID - Drain Current - A
-100 -4.0 V
ID - Drain Current - A
-30
VGS = -4.5 V
-2.5 V
-10 -1 -0.1 -0.01 -0.001
VDS = -10 V Pulsed
-20 -1.8 V -10
TA = 125C 75C 25C -25C
0 0 -0.2 -0.4 -0.6 -0.8 -1
VDS - Drain to Source Voltage - V
-0.0001 0 -0.5 -1 -1.5 -2
VGS - Gate to Source Voltage - V
GATE CUT-OFF VOLTAGE vs. CHANNEL TEMPERATURE
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT | yfs | - Forward Transfer Admittance - S
-1
VGS(off) - Gate Cut-off Voltage - V
VDS = -10 V ID = -1.0 mA
100 VDS = -10 V Pulsed
-0.8
10 TA = -25C 25C 75C 125C
-0.6
1
-0.4 -50 0 50 100 150
Tch - Channel Temperature - C
0.1 -0.01
-0.1
-1
-10
-100
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE RDS(on) - Drain to Source On-state Resistance - m RDS(on) - Drain to Source On-state Resistance - m
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
40 Pulsed VGS = -1.8 V, ID = -1.5 A 30 VGS = -2.5 V, ID = -4.5 A
40 Pulsed 30
20
20 ID = -4.5 A 10
10
VGS = -4.0 V, ID = -4.5 A VGS = -4.5 V, ID = -4.5 A
0 -50 0 50 100 150
Tch - Channel Temperature - C
0 0 -2 -4 -6 -8
VGS - Gate to Source Voltage - V
4
Data Sheet G16252EJ1V0DS
PA1816
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT RDS(on) - Drain to Source On-state Resistance - m RDS(on) - Drain to Source On-state Resistance - m DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
20
VGS = -4.5 V Pulsed TA = 125C
20
VGS = -4.0 V Pulsed TA = 125C
15
75C 25C
15
75C 25C -25C
10
-25C
10
5 -0.01
-0.1
-1
-10
-100
5 -0.01
-0.1
-1
-10
-100
ID - Drain Current - A
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT RDS(on) - Drain to Source On-state Resistance - m
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT RDS(on) - Drain to Source On-state Resistance - m
40
VGS = -2.5 V Pulsed TA = 125C 75C 25C -25C
40
VGS = -1.8 V Pulsed
30
30
20
20 TA = 125C 75C 25C -25C
10
10
0 -0.01
-0.1
-1
-10
-100
0 -0.01
-0.1
-1
-10
-100
ID - Drain Current - A
ID - Drain Current - A
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
10000
td(on), tr, td(off), tf - Switching Time - ns Ciss, Coss, Crss - Capacitance - pF
10000 VGS = 0 V f = 1.0 MHz
1000
tf td(off)
VDD = -10 V VGS = -4.0 V RG = 10
Ciss 1000
100 td(on) 10 tr
Coss Crss 100 -0.1
-1
-10
-100
1 -0.01
-0.1
-1
-10
VDS - Drain to Source Voltage - V
ID - Drain Current - A
Data Sheet G16252EJ1V0DS
5
PA1816
SOURCE TO DRAIN DIODE FORWARD VOLTAGE DYNAMIC INPUT/OUTPUT CHARACTERISTICS
100 Pulsed
VGS - Gate to Source Voltage - V IF - Diode Forward Current - A
-5
ID = -9.0 A
-4 VDD = -10 V -6.0 V -2.0 V
10
-3
1
VGS = 0 V
-2
0.1
-1
0.01 0.4 0.6 0.8 1 1.2
VF(S-D) - Source to Drain Voltage - V
0 0 5 10 15 20
QG - Gate Charge - nC
6
Data Sheet G16252EJ1V0DS
PA1816
[MEMO]
Data Sheet G16252EJ1V0DS
7
PA1816
* The information in this document is current as of July, 2002. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information. * No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document. * NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others. * Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. * While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features. * NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots "Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) "Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application. (Note) (1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries. (2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above).
M8E 00. 4

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